SINKER Launches First 48GB DDR5 RDIMM Server Memory with ChangXin Granules
Jiahe Jinwei's sub-brand SINKER has launched a DDR5 RDIMM 48GB server memory running at 5600MT/s, the first 48GB non-binary capacity server memory built on domestic ChangXin granules. Since May 2026, SINKER server memory has fully adopted ChangXin DDR5 granules, following earlier 64GB, 32GB and 16GB DDR5-5600 RDIMM releases. The module features a dual ECC architecture, 1.1V low-voltage design and per-module bandwidth exceeding 44.8GB/s, verified through wide-temperature burn-in and ±5% voltage margin testing.
Jiahe Jinwei's sub-brand SINKER has launched a DDR5 RDIMM 48GB 5600MT/s server memory equipped with domestic ChangXin granules, marking the first 48GB non-binary capacity server memory built on domestic granules. Since May 2026, SINKER server memory has fully adopted ChangXin DDR5 granules, having previously released 64GB, 32GB and 16GB DDR5-5600 RDIMM products.
The newly released 48GB specification uses domestic DRAM wafers for self-packaging. From the wafer intake stage, each chip undergoes electrical parameter scanning, leakage characteristics testing, impedance consistency verification and process defect screening, keeping single-chip electrical parameter deviation within the industry's minimal allowable thresholds. The module adopts a standard 2Rank×8 (2R8) DRAM bit-width arrangement, designed for high-density server expansion, enabling TB-level total memory capacity in single-socket or dual-socket servers and suiting scenarios with large memory demands such as virtual machine clusters, in-memory databases and AI large-model loading.
The memory operates at 5600MT/s, equivalent to PC5-44800, with per-module bandwidth exceeding 44.8GB/s, double that of DDR4 architecture. It adopts a standard 1.1V low-voltage design, with an onboard PMIC power management chip providing intelligent voltage regulation and power control. The product carries a dual ECC architecture combining on-die ECC and external ECC, capable of automatically detecting and correcting single-bit and even multi-bit data errors.
In dedicated validation tests, technicians manually simulated single-bit and multi-bit error scenarios, and the dual ECC architecture's detection, correction and alert functions were all effectively verified. Official environmental testing included 7×24-hour full-load burn-in under wide temperatures from 45°C to 85°C, supplemented by high-low temperature cycling and humidity tolerance tests to simulate extreme data-center conditions. Power testing included voltage margin tests verifying operational stability within a ±5% voltage fluctuation range, with no restarts, no crashes and no performance degradation recorded during testing.
Why this event matters
The event has a measured impact on 1 industry. The strongest current signal is positive for Semiconductor Value Chain, with intensity 60/100 and 80% confidence over a short term horizon.
Impact figures are analytical estimates that combine direction, intensity, confidence and event importance. They are not investment advice.